Tunnel crack detection and classification system based on image processing.
| Autor: | Liu, Zhiwei, Suandi, Shahrel A., Ohashi, Takeshi, Ejima, Toshiaki |
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| Zdroj: | Proceedings of SPIE; Nov2002, Issue 1, p145-152, 8p |
| Databáze: | Complementary Index |
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