High-resolution fluorocarbon-based resist for 157-nm lithography.

Autor: Fedynyshyn, Theodore H., Mowers, William A., Kunz, Roderick R., Sinta, Roger F., Sworin, Michael, Goodman, Russell B.
Zdroj: Proceedings of SPIE; Nov2002, Issue 1, p29-40, 12p
Databáze: Complementary Index