ArF imaging with off-axis illumination and subresolution assist bars: a compromise between mask constraints and lithographic process constraints.

Autor: Trouiller, Yorick, Serrand, J., Miramond, Corinne, Rody, Yves F., Manakli, Serdar, Goirand, Pierre-Jerome
Zdroj: Proceedings of SPIE; Nov2002, Issue 1, p1522-1529, 8p
Databáze: Complementary Index