Polarized reflectometry of land mines at 814 nanometers.
Autor: | Derzko, Zenon I., Barr, Dallas N. |
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Zdroj: | Proceedings of SPIE; Nov2002, Issue 1, p942-949, 8p |
Databáze: | Complementary Index |
Externí odkaz: |
Autor: | Derzko, Zenon I., Barr, Dallas N. |
---|---|
Zdroj: | Proceedings of SPIE; Nov2002, Issue 1, p942-949, 8p |
Databáze: | Complementary Index |
Externí odkaz: |