Improved model of HgCdTe's pseudo dielectric function for in-situ ellipsometry data analysis during MBE growth.

Autor: Badano, Giacomo, Garland, James W., Zhao, Jun, Sivananthan, Sivalingam
Zdroj: Proceedings of SPIE; Nov2002, Issue 1, p70-75, 6p
Databáze: Complementary Index