Improved model of HgCdTe's pseudo dielectric function for in-situ ellipsometry data analysis during MBE growth.
Autor: | Badano, Giacomo, Garland, James W., Zhao, Jun, Sivananthan, Sivalingam |
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Zdroj: | Proceedings of SPIE; Nov2002, Issue 1, p70-75, 6p |
Databáze: | Complementary Index |
Externí odkaz: |