Raster Shaped Beam Pattern Generation for 70 nm Photomask Production.

Autor: Newman, Thomas H., Finklestein, Ira, Kao, Huei-Mei, Krishnaswami, Sriram, Long, Darryn, Lozes, Richard L., Pearce-Percy, Henry T., Sagle, Allan L., Varner, Jeffrey K., Winter, Stacey, Gesley, Mark A., Abboud, Frank E.
Zdroj: Proceedings of SPIE; Nov2002, Issue 1, p168-176, 9p
Databáze: Complementary Index