Optoelectronic system for size inspection of round through holes in sieves.
| Autor: | Bondar, D. N., Budanov, N. V., Budantsev, A. V., Emelyanov, E. L., Obidin, Yu. V., Paterikin, V. I., Petukhov, K. V., Potashnikov, A. K. |
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| Zdroj: | Proceedings of SPIE; Nov2002, Issue 1, p669-676, 8p |
| Databáze: | Complementary Index |
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