Raman studies as a tool for characterization of the strained hexagonal GaN/AlxGa1-xN superlattices.
| Autor: | Davydov, V. Y., Smirnov, A. N., Goncharuk, I. N., Kyutt, R. N., Scheglov, M. P., Baidakova, M. V., Lundin, W. V., Zavarin, E. E., Smirnov, M. B., Karpov, S. V., Harima, H. |
|---|---|
| Zdroj: | Proceedings of SPIE; Nov2002, Issue 1, p146-149, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|