Ellipsometric scatterometry for sub-0.1-m CD measurements.

Autor: Coulombe, Stephen A., Logofatu, Petre-Catalin, Minhas, Babar K., Naqvi, S. Sohail H., McNeil, John R.
Zdroj: Proceedings of SPIE; Nov1998 Part 2, Issue 1, p282-293, 12p
Databáze: Complementary Index