Effect of the dissolution contrast on process margins in 193-nm lithography.

Autor: Takahashi, Makoto, Kishimura, Shinji, Naito, Takuya, Ohfuji, Takeshi, Sasago, Masaru
Zdroj: Proceedings of SPIE; Nov1998 Part 2, Issue 1, p195-204, 10p
Databáze: Complementary Index