Modeling of synchrotron reflectance calibrations of AXAF iridium-coated witness mirrors over 2 to 12 keV.
| Autor: | Graessle, Dale E., Blake, Richard L., Burek, Anthony J., Dyson, S. E., Fitch, Jonathan J., Schwartz, Daniel A., Soufli, Regina |
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| Zdroj: | Proceedings of SPIE; Nov1998, Issue 1, p140-159, 20p |
| Databáze: | Complementary Index |
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