Resist charging in electron-beam lithography.

Autor: Bai, Min, Pickard, Daniel S., Tanasa, Corina, McCord, Mark A., Berglund, C. Neil, Pease, Roger Fabian W.
Zdroj: Proceedings of SPIE; Nov1998 Part 2, Issue 1, p383-388, 6p
Databáze: Complementary Index