Detection of flaws and defects using lateral migration x-ray radiography.
| Autor: | Dugan, Edward T., Jacobs, Alan M., Houssay, Laurent, Ekdahl, Dan |
|---|---|
| Zdroj: | Proceedings of SPIE; Nov2004, Issue 1, p47-61, 15p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Dugan, Edward T., Jacobs, Alan M., Houssay, Laurent, Ekdahl, Dan |
|---|---|
| Zdroj: | Proceedings of SPIE; Nov2004, Issue 1, p47-61, 15p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|