Development of phase shift masks for extreme ultraviolet lithography and optical evaluation of phase shift materials.

Autor: Han, Sang-In, Weisbrod, Eric, Wasson, James R., Gregory, Rich, Xie, Qianghua, Mangat, Pawitter J. S., Hector, Scott D., Dauksher, William J., Rosfjord, Kristine M.
Zdroj: Proceedings of SPIE; Nov2004, Issue 1, p261-270, 10p
Databáze: Complementary Index