Reducing measurement uncertainty drives the use of multiple technologies for supporting metrology.
| Autor: | Banke Jr., Bill, Archie, Charles N., Sendelbach, Matthew, Robert, Jim, Slinkman, James A., Kaszuba, Phil, Kontra, Rick, DeVries, Mick, Solecky, Eric P. |
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| Zdroj: | Proceedings of SPIE; Nov2004, Issue 1, p133-150, 18p |
| Databáze: | Complementary Index |
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