Customized illumination schemes for critical layers of 90-nm node dense memory devices in ArF lithography: comparison between simulation and experimental results.

Autor: Capetti, Gianfranco, Bollin, Maddalena, Pepe, Annalisa, Cotti, Gina, Loi, Sara, Iessi, Umberto
Zdroj: Proceedings of SPIE; Nov2004, Issue 1, p881-893, 13p
Databáze: Complementary Index