Ion-beam sputter-deposited SiN/TiN attenuating phase-shift photoblanks.

Autor: Dieu, Laurent, Carcia, Peter F., Mitsui, Hideaki, Ueno, Kunihiko
Zdroj: Proceedings of SPIE; Nov2001, Issue 1, p810-817, 8p
Databáze: Complementary Index