Detection of contamination on selected apple cultivars using reflectance hyperspectral and multispectral analysis.
| Autor: | Mehl, Patrick M., Chao, Kevin, Kim, Moon S., Chen, Yud-Ren |
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| Zdroj: | Proceedings of SPIE; Nov2001, Issue 1, p201-213, 13p |
| Databáze: | Complementary Index |
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