Optimization of ArF resist for 100-nm node: DOE and fine-tuning of basic platform.

Autor: Kim, Keeho, Wells, Gregory M., Kim, Won D., Choi, Yong-Jun, Choi, Se-Jin, Kim, Yang-Sook, Kim, Deog-Bae
Zdroj: Proceedings of SPIE; Nov2001, Issue 1, p168-178, 11p
Databáze: Complementary Index