High-resolution fluorocarbon-based resist for 157-nm lithography.

Autor: Fedynyshyn, Theodore H., Kunz, Roderick R., Sinta, Roger F., Sworin, Michael, Mowers, William A., Goodman, Russell B., Doran, Scott P.
Zdroj: Proceedings of SPIE; Nov2001, Issue 1, p296-307, 12p
Databáze: Complementary Index