Lens aberration measurement and analysis using a novel pattern.

Autor: Nam, Byung-Ho, Cho, Byeong-Ho, Park, Jong O, Kim, Dong-Seok, Baek, SungJin, Jeong, JongHo, Nam, ByungSub, Hwang, Young J., Song, Young Jin
Zdroj: Proceedings of SPIE; Nov2001, Issue 1, p1290-1299, 10p
Databáze: Complementary Index