Experimental investigation, modeling, and simulations for MEMS-based gas sensor used for monitoring process chambers in semiconductor manufacturing.

Autor: Jafri, Ijaz H., DiMeo Jr., Frank, Neuner, Jeffrey W., DiMascio, Sue, Marchetti, James
Zdroj: Proceedings of SPIE; Nov2001, Issue 1, p35-44, 10p
Databáze: Complementary Index