Microstructure of thin films: correlation with laser damage threshold.
| Autor: | Ciosek, Jerzy, Paszkowicz, Wojciech, Pankowski, Piotr, Pelka, Jerzy B., Baczewski, Lech T., Marczak, Jan, Ostrowski, Roman |
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| Zdroj: | Proceedings of SPIE; Nov2001, Issue 1, p276-280, 5p |
| Databáze: | Complementary Index |
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