Characterization of high-quality synthetic diamond crystals by m-resolved x-ray diffractometry and topography.
| Autor: | Hoszowska, Joanna, Freund, Andreas K., Ishikawa, Tetsuya, Sellschop, Jacques P., Rebak, M., Burns, R. C., Hansen, J. O., Welch, D. L., Hall, C. E. |
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| Zdroj: | Proceedings of SPIE; Nov2001, Issue 1, p106-117, 12p |
| Databáze: | Complementary Index |
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