Soft x-ray microscopy with a 182-angstrom soft x-ray laser.
| Autor: | DiCicco, Darrell S., Kim, Dong-Su, Polonskiy, Leonid, Skinner, Charles H., Suckewer, Szymon |
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| Zdroj: | Proceedings of SPIE; Nov1993, Issue 1, p160-169, 10p |
| Databáze: | Complementary Index |
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