Atomic force microscopy employed as the final imaging stage for soft x-ray contact microscopy.
| Autor: | Cotton, Robin A., Dooley, Mike D., Fletcher, Julian H., Stead, Anthony D., Ford, Thomas W. |
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| Zdroj: | Proceedings of SPIE; Nov1993, Issue 1, p204-212, 9p |
| Databáze: | Complementary Index |
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