Integrated test and package methods for integrated photonics.

Autor: Carson, Richard F., Kravitz, Stanley H., Hietala, Vincent M., Harff, Nathan E., Armendariz, Marcelino G., Vawter, G. Allen
Zdroj: Proceedings of SPIE; Nov1993, Issue 1, p243-254, 12p
Databáze: Complementary Index