Fabrication, alignment, and test of an all-reflective soft x-ray microlithography objective.

Autor: Castle, Kenneth R., Ruda, Mitchell C., Gleeson, Timothy M., Tichenor, Daniel A., Bjorkholm, John E., Himel, Marc D., Jewell, Tanya E.
Zdroj: Proceedings of SPIE; Nov1993, Issue 1, p27-35, 9p
Databáze: Complementary Index