Measurement of charge limit in a strained lattice GaAs photocathode.
| Autor: | Saez, P., Alley, Ray K., Aoyagi, H., Clendenin, James, Frisch, Josef C., Garden, C., Hoyt, Earl, Kirby, Bob, Klaisner, L., Kulikov, A., Prescott, C., Schultz, D., Tang, Huan, Turner, James L., Witte, Klaus H., Woods, Michael B., Zolotorev, M. |
|---|---|
| Zdroj: | Proceedings of SPIE; Nov1993, Issue 1, p45-50, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|