| Autor: |
Carlone, Cosmo, Parenteau, Martin |
| Předmět: |
|
| Zdroj: |
Journal of Applied Physics; 5/15/1998, Vol. 83 Issue 10, p5164, 7p, 2 Charts, 6 Graphs |
| Abstrakt: |
Provides information on an experimental study determining by photoluminescence (PL) the permanent damage caused by gigaelectron-volt (GeV) particles incident on n-GaAs samples. Vacancy defects of irradiated GaAs; Methodology used to conduct the experiment; Indepth look at the irradiations with heavy ions; Results of the experiment. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
|
