High resolution electron microscopy of the high- T c Superconductor Bi2+ xSr2Ca1- xCu2O8+δ.
| Autor: | Zhou, W., Kirkland, A. I., Mackay, K. D., Armstrong, A. R., Harrison, M. R., Jefferson, D. A., Liang, W. Y., Edwards, P. P. |
|---|---|
| Zdroj: | Advanced Materials; 1989, Vol. 1 Issue 6, p196-199, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
Plný text