Análise da superfície de grês porcelanato por microscopia de força atômica.

Autor: Fernandes, M. C. S., Paulin Filho, P. I., Morelli, M. R.
Předmět:
Zdroj: Ceramica; abr2011, Vol. 57 Issue 342, p173-179, 7p
Abstrakt: The article presents a study which analyzes the surface of polished porcelain stoneware tile surface through atomic force microscopy (AFM). The study shows the reduction of the surface roughness of the porcelain stoneware tile surface in the polishing stages with larger grains and the intervention of the abrasives having smaller grains in superficial roughness. It also notes that the application of the polymeric resin in the surface covering of the product has reduced its gloss.
Databáze: Complementary Index