Electron Microscopy and Diffraction of Thin Films: Interpretation and Correlation of Images and Diffraction Patterns.
| Autor: | Otte, H. M., Dash, J., Schaake, H. F. |
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| Zdroj: | Physica Status Solidi (B); 1964, Vol. 5 Issue 3, p527-549, 23p |
| Databáze: | Complementary Index |
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