Formation of high resolution X-ray diffraction pictures of crystal imperfections, their distortionless detection and unique interpretation.

Autor: Bezirganyan, P. H., Aboyan, A. O., Khzardzhyan, A. A.
Zdroj: Crystal Research & Technology; Oct1990, Vol. 25 Issue 10, p1169-1182, 14p
Databáze: Complementary Index
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