Characterization of II-VI semiconductor compounds grown by metallo-organic chemical vapour deposition.

Autor: Christiansz, G. I., Georgiou, S., Kwietniak, M. S., Pain, G. N., Usher, B., Warminski, T., Glanvill, S. R., Rossouw, C. J., Stevenson, A. W., Wilkins, S. W., Wielunski, L.
Zdroj: XRS: X-ray Spectrometry; Apr1990, Vol. 19 Issue 2, p79-83, 5p
Databáze: Complementary Index