Evaluation of the use of Gaussian ϕ(ρz) curves in quantitative electron probe microanalysis: A new optimization.

Autor: Bastin, G. F., Van Loo, F. J. J., Heijligers, H. J. M.
Zdroj: XRS: X-ray Spectrometry; Feb1984, Vol. 13 Issue 2, p91-97, 7p
Databáze: Complementary Index
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