A new quantitative Raman measurement scheme using Teflon as a novel intensity correction standard as well as the sample container.

Autor: Nah, Sanghee, Kim, Donghyuk, Chung, Hoeil, Han, Sung-Hwan, Yoon, Moon-Young
Zdroj: Journal of Raman Spectroscopy; May2007, Vol. 38 Issue 5, p475-482, 8p
Databáze: Complementary Index
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