| Autor: |
Giakos, George C., Guntupalli, R., Shah, N., Vedantham, S., Suryanarayanan, S., Chowdhury, S., Nemer, R., Passerini, A.G., Mehta, K., Sumrain, S., Patnekar, N., Nataraj, K., Evans, E.A., Endorf, R., Russo, Fabrizio |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Instrumentation & Measurement; Dec2001, Vol. 50 Issue 6, p1604, 6p, 3 Diagrams, 1 Chart, 7 Graphs |
| Abstrakt: |
Presents a study that measured the detected contrast and dynamic ranges of cadmium[sub1-x] zinc[subx] tellurium semiconductor detectors within the x-ray diagnostic energy range using a contrast sensitivity phantom. Aim of the study; Detected contrast and dynamic range; Experimental description and results. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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