Measurement of the Lattice Parameter of Silicon, using a Double-diffraction Effect.
| Autor: | ISHERWOOD, B. J., WALLACE, C. A. |
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| Zdroj: | Nature; 10/8/1966, Vol. 212 Issue 5058, p173-175, 3p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | ISHERWOOD, B. J., WALLACE, C. A. |
|---|---|
| Zdroj: | Nature; 10/8/1966, Vol. 212 Issue 5058, p173-175, 3p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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