Autor: |
Joseph, Shyla, Joseph, James T., John, Annamma, Thomas, J. K., Solomon, Sam |
Předmět: |
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Zdroj: |
Journal of Materials Science: Materials in Electronics; Jul2011, Vol. 22 Issue 7, p741-744, 4p |
Abstrakt: |
LnTiSbNbO (Ln = Ce, Pr) ceramics were prepared by the conventional solid state ceramic route for x = 0, 0.05, 0.1, 0.15, 0.2 and 0.25. The structure of the materials was analyzed using X-ray diffraction techniques. The cell parameters and the theoretical densities of the samples were calculated using least square methods. The samples are sintered to more than 90% of the theoretical density at 1,325-1,350 °C. The microwave dielectric properties were measured using the cavity resonator method. The surface morphology of the sintered sample was analyzed using Scanning Electron Microscopy. All the materials have good microwave dielectric properties and are suitable for dielectric resonator applications. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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