Monitoring surface roughness by means of doubly scattered image speckle.
| Autor: | Yoshimura, Takeaki, Miyazaki, Eiichi, Nakanishi, Kunifumi |
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| Zdroj: | Optical Engineering; Jun1993, Vol. 32 Issue 6, p1354-1359, 6p |
| Databáze: | Complementary Index |
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