| Autor: |
Alam, Muhammad Ashraful, Weir, Bonnie E., Silverman, Paul J. |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Electron Devices; Feb2002, Vol. 49 Issue 2, p232, 7p, 1 Black and White Photograph, 3 Diagrams, 7 Graphs |
| Abstrakt: |
Part I. Proposes a theory of the statistical origin of soft and hard breakdown, that can explain a wide range of experimental data. Basis of the theory; Information on the circuit model for breakdown transient; Distribution of percolation conductance. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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