Precision, all-optical measurement of external quantum efficiency in semiconductors.

Autor: Chengao Wang, Chia-Yeh Li, Hasselbeck, Michael P., Imangholi, Babak, Sheik-Bahae, Mansoor
Předmět:
Zdroj: Journal of Applied Physics; May2011, Vol. 109 Issue 9, p093108, 10p, 3 Diagrams, 2 Charts, 13 Graphs
Abstrakt: External quantum efficiency of semiconductor photonic devices is directly measured by wavelength-dependent laser-induced temperature change (scanning laser calorimetry) with very high accuracy. Maximum efficiency is attained at an optimum photo-excitation level that can be determined with an independent measurement of power-dependent temperature or power-dependent photoluminescence. Time-resolved photoluminescence lifetime and power-dependent photoluminescence measurements are used to evaluate unprocessed heterostructures for critical performance parameters. The crucial importance of parasitic background absorption is discussed. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index