In-depth resolved Raman scattering analysis for the identification of secondary phases: Characterization of Cu2ZnSnS4 layers for solar cell applications.

Autor:	Fontané, X., Calvo-Barrio, L., Izquierdo-Roca, V., Saucedo, E., Pérez-Rodriguez, A., Morante, J. R., Berg, D. M., Dale, P. J., Siebentritt, S.
Předmět:	RAMAN effect WAVELENGTHS X-ray diffraction SOLAR cells SPECTRUM analysis PHYSICS
Zdroj:	Applied Physics Letters; 5/2/2011, Vol. 98 Issue 18, p181905, 3p, 3 Maps
Abstrakt:	This work reports the in-depth resolved Raman scattering analysis with different excitation wavelengths of Cu2ZnSnS4 layers. Secondary phases constitute a central problem in this material, particularly since they cannot be distinguished by x-ray diffraction. Raman spectra measured with 325 nm excitation light after sputtering the layers to different depths show peaks that are not detectable by excitation in the visible. These are identified with Cu3SnS4 modes at the surface region while spectra measured close to the back region show peaks from ZnS and MoS2. Observation of ZnS is enhanced by resonant excitation conditions achieved when working with UV excitation. [ABSTRACT FROM AUTHOR]
Databáze:	Complementary Index
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