Autor: |
Pai-Yen Chen, Tsung-Chieh Cheng, Jiann Shieh, Yun-Cin Luo |
Předmět: |
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Zdroj: |
Applied Physics Letters; 4/18/2011, Vol. 98 Issue 16, p163106, 3p, 1 Color Photograph, 2 Graphs |
Abstrakt: |
We performed in situ field emission (FE) measurements on vacuum nanodiodes with a dynamically tunable nanogap, ranging from 20 to 150 nm. The nanogap was precisely controlled by a scanning tungsten probe (anode) attached on the nanomotor, thereby allowing the accurate and flexible three-dimensional FE characterization for silicon nanowire emitters (cold cathode). Our experimental results show that the local field enhancement factor and the onset voltage are sensitively dependent on the nanogap size, agreeing quite well with the theoretical fitting curve. Moreover, efficient and low-power driving FE nanodevices are envisioned by aggressively reducing the nanogap and squeezing nanodiodes. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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