| Autor: |
Gottesman, Y., Rao, E.V.K., Piot, D., Vergnol, E., Dagens, B. |
| Předmět: |
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| Zdroj: |
Applied Physics B: Lasers & Optics; 2001, Vol. 73 Issue 5/6, p609, 4p |
| Abstrakt: |
This paper describes a comprehensive report on the high potential of optical low-coherence reflectometry (OLCR) measurements to assist the design optimization and performance evaluation of symmetric MMI couplers. Using three sets of deep-ridge InGaAsP–InP couplers on InP and by performing OLCR measurements simultaneously in reflection and transmission modes, the nature and origin of all reflections in MMI have first been identified with respect to a deliberately chosen design parameter, namely, the coupler length. In addition, and in total agreement with the self-imaging principle and also the BPM simulations, the back reflections in combiner mode are shown to be prominent even in fully optimized devices. Finally, a simple design artifact has been proposed and demonstrated experimentally for the first time to suppress back reflections. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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