Automated Sample Preparation of Nanoscale Devices for FESEM.

Autor: Cerchiara, RR, Fischione, PE, Boccabella, MF, Robins, AC
Zdroj: Microscopy & Microanalysis; Jul2009 Supplement 2, Vol. 15 Issue S2, p1076-1077, 2p
Abstrakt: Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009 [ABSTRACT FROM PUBLISHER]
Databáze: Complementary Index