Nanomilling for Aberration – Corrected TEM and HAADF STEM.
| Autor: | Cerchiara, RR, Fischione, PE, Liu, J, Matesa, JM, Robins, AC, Fraser, HL, Genc, A |
|---|---|
| Zdroj: | Microscopy & Microanalysis; Jul2009 Supplement 2, Vol. 15 Issue S2, p348-349, 2p |
| Abstrakt: | Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009 [ABSTRACT FROM PUBLISHER] |
| Databáze: | Complementary Index |
| Externí odkaz: |
|