Autor: |
Berger, Joel A., Schroeder, W. Andreas |
Předmět: |
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Zdroj: |
Journal of Applied Physics; Dec2010, Vol. 108 Issue 12, p124905, 12p, 1 Diagram, 6 Graphs |
Abstrakt: |
The analytical Gaussian electron pulse propagation model of Michalik and Sipe [J. Appl. Phys. 99, 054908 (2006)] is extended to include the action of external forces on the pulse. The resultant ability to simulate efficiently the effect of electron optical elements (e.g., magnetic lenses and radio-frequency cavities) allows for the rapid assessment of electron pulse delivery systems in time-resolved ultrafast electron diffraction and microscopy experiments. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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