Novel Applications of Zeiss Libra 200 Cs-Corrected TEM with Energy Filtered Precession Electron Diffraction for Structure Determination of Nanocrystals.
| Autor: | Nicolopoulos, S., Bultreys, D., Pavia, G., Benner, G., Niebel, H., Gemmi, M., Janssens, B. |
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| Zdroj: | Microscopy & Microanalysis; Jul2010 Supplement, Vol. 16 Issue S2, p26-27, 2p |
| Abstrakt: | Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010. [ABSTRACT FROM PUBLISHER] |
| Databáze: | Complementary Index |
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